List of publications (January 2013)
0. M.Sc. Thesis
Hatzopoulos A. A., “Microprocessor-based Far Infrared Spectrophotometer”, MSc Thesis, Dept. of Physics, Postgraduate program in Electronics, University of Thessaloniki, 1983 (in Greek).
1. Ph.D. Dissertation
Hatzopoulos A.A., “Fault Diagnosis in Analog Electronic Circuits: Study, Development and Computer Implementation”, Ph.D. Dissertation, Dept. of Electrical Engineering, University of Thessaloniki, 1989 (in Greek).
2. Publications in international journals with review process
[2.1] Hatzopoulos A.A., Halatsis C., “Microprocessor-based Far Infrared Spectrophotometer”, Review of Scientific Instruments, pp 1498-1502, Sept. 1984.
[2.2] Hatzopoulos A. A., Theophilidis G., “A Simple Electronic unit Allowing Extracellular Recording and Stimulation through the Same Wire Hook or Suction Electrode”, Journal of Neuroscience Methods, pp 169-172, v. 11, 1984.
[2.3] Hatzopoulos A.A., Kontoleon J.M., “Computer Simulation of Testing Procedures for Fault Diagnosis in Analog Circuits”, AMSE Modeling, Simulation and Control, vol. 8, No.2, pp 37-48, Autumn 1986.
[2.4] Hatzopoulos A.A., Kontoleon J.M., “Efficient Fault Diagnosis in Analogue Circuits using a Branch Decomposition Approach”, IEE Proc., Pt.G: Electronic Circuits and Systems, vol. 134, No.4, pp 149-157, August 1987.
[2.5] Hatzopoulos A.A., Kontoleon J.M., “A New Approach for the Automatic Fault Diagnosis in Analog Circuits”, Int. J. of Circuit Theory and Applications, vol. 18, pp 387-400, 1989.
[2.6] Hatzopoulos A.A., Kontoleon J.M., “Fault Diagnosis in large Analogue Circuits based on Hybrid Decomposition”, IEE Proc., Pt. G: Electronic Circuits and Systems, vol.139, No. 3, pp 311-318, June, 1992.
[2.7] Ηatzopoulos A.A., “Reducing the number of nonzero elements of topological loop (B) and cutset (D) matrices”, IEE Electronics Letters, Vol. 28, No. 17, pp 1577-1579, 13th August 1992.
[2.8] Papakostas D.K., Hatzopoulos A.A., “Analogue Fault Identification based on power supply current spectrum”, IEE Electronics Letters, Vol. 29, No. 1, pp 118-119, 7th January 1993.
[2.9] Hatzopoulos A.A., Siskos S., Kontoleon J.M., “A complete scheme of Built-in Self-test (BIST) structure for fault diagnosis in analog circuits and systems”, ΙΕΕΕ Τr. Instrumentation and Measurement, Vol. 42, No 3, June 1993.
[2.10] Athanasiades A., Hatzopoulos A.A., Theophilidis G., “A data-acquisition system for the analysis of the isometric tension generated by an electrically stimulated skeletal muscle”, Computer Applications in the Biosciences, vol. 9, No 3, June 1993.
[2.11] Siskos S., Hatzopoulos A.A., “Versatile CMOS comparator with adjustable window and digital input reference”, Int. J. of Electronics, vol. 74, no. 6, pp 933-938, 1993.
[2.12] Papakostas D.K., Hatzopoulos A.A., “Correlation-based comparison of analog signatures for identification and fault diagnosis”, IEEE Tr. Instrumentation and Measurement, Vol. 42, No 4, pp 860-863, August 1993.
[2.13] Papakostas D.K., Hatzopoulos A.A., “Supply current testing in linear bipolar ICs”, IEE Electronics Letters, Vol. 30, No 2, pp 128-130, 1994.
[2.14] Hatzopoulos A.A., Siskos S., Laopoulos Th., “Current conveyor based test structures for mixed-signal circuits”, IEE Proc., Pt. G: Circuits, Devices and Systems, vol. 144, No. 4, August, 1997.
[2.15] Hatzopoulos A.A., Siskos S., “A simple built-in current sensor for analog and mixed-signal testing”, IEEE Tr. Instrumentation and Measurement, Vol. 46, No 6, Dec. 1997
[2.16] Hatzopoulos A.A., Iatrou E., Katsaras Chr., Papakostas D.K., “Testing of analog and mixed-signal circuits by using supply current measurements”, IEE Proc., Pt. G: Circuits, Devices and Systems, vol. 145, no 5, 1998, pp 319-324.
[2.17] Hatzopoulos A.A., “Computer-aided circuit analysis and design projects for Electronic Engineering students”, IEE Engineering Science and Education Journal, vol. 8, no 1, 1999, pp 23-32.
[2.18] Papakostas D.K., Hatzopoulos A.A., “Estimation of statistical variables for analog fault detectability evaluation”, IEE Proc., Pt. G: Circuits, Devices and Systems, vol. 146, no 6, Dec. 1999, pp 350-354.
[2.19] Papakostas D.K., Hatzopoulos A.A., “Estimation of circuit output measurements including statistically depended parameters”, Int. J. of Circuit Theory and Applications, vol. 31, 2003, pp. 219-228.
[2.20] Papakostas D.K., Hatzopoulos A.A., “Impact of parameter covariance on fault detectability estimation of analog and mixed-mode circuits”, IEE Proc. Circuits, Devices and Systems, Vol.: 150, Issue: 5, 6 Oct. 2003, pp: 434-8.
[2.21] Papakostas D.K., Hatzopoulos A.A., “Detection of time-delay related faults using Fourier phase components of power supply current ”, IEE Electronics Letters, vol. 40(1), Jan. 2004, pp. 7-8.
[2.22] Papakostas D.K., Hatzopoulos A.A., “Analogue Fault Detectability Comparison Between Power Supply Current and Output Voltage Magnitude and Phase Spectrum Components”, IEE Electronics Letters, Volume: 40(8) , 15 April 2004, pp: 457 – 458.
[2.23] A.T. Hatzopoulos, D.H. Tassis, N.A. Hastas, C.A. Dimitriadis, S. Siskos, and A.A. Hatzopoulos, “A simple and continuous on-state current model of polysilicon thin-film transistors for circuit simulation”, Journal of Physics: Conference Series 10 (2005) pp. 27-30.
[2.24] A. A. Hatzopoulos, S. Siskos, C. A. Dimitriadis, N. Papadopoulos, I. Pappas and L. Nalpantidis, “A built-in current sensor using thin-film transistors”, Journal of Physics: Conference Series 10 (2005) pp. 289-293.
[2.25] I Pappas, L Nalpantidis, V Kalenteridis, S Siskos, C.A. Dimitriadis and A.A. Hatzopoulos, “A study of different types of current mirrors using polysilicon TFTs”, Journal of Physics: Conference Series 10 (2005) pp. 373-376.
[2.26] Papadopoulos, N. P., Hatzopoulos A.A., Papakostas D.K., CH. A. Dimitriadis, S. Siskos, “Modeling the impact of light on the performance of polycrystalline thin-film transistors at the sub-threshold region”, Microelectronics Journal, Elsevier, Vol. 37, Issue 11, November 2006, Pages 1313-1320.
[2.27] N. Arpatzanis, C. A. Dimitriadis, S. Siskos, A. A. Hatzopoulos, G. Kamarinos, “Determination of bulk and interface density of states in polycrystalline silicon thin film transistors”, Thin Solid Films, Elsevier, 515, pp. 7581-7584, 2007.
[2.28] A. A. Hatzopoulos, S. Stefanou, G. Gielen, D. Schreurs, “Resolving Differences of Parameter Extraction Methods for Integrated Inductor Design and Model Validation”, Analog Integrated Circuits and Signal Processing , Springer, 53 (2-3), pp. 71-79, 2007.
[2.29] Papakostas D.K., Hatzopoulos A.A., “A unified procedure for fault detection of analog and mixed-mode circuits using magnitude and phase components of the power supply current spectrum”, IEEE Tr. on Instrumentation and Measurement 57 (11), pp. 2589-2595, 2008.
[2.30] M. Drakaki, A. A. Hatzopoulos, S. Siskos, “A Comparative Evaluation of De-Embedding Methods for on-Wafer RF CMOS Inductor S-parameter Measurements”, Physica Status Solidi (C) 5, No. 12, WILEY-VCH, pp. 3671–3676, 2008.
[2.31] N. P. Papadopoulos, A. A. Hatzopoulos, D.K.Papakostas, “An Improved Optical Feedback Pixel Driver Circuit”, IEEE Tr. on Electron Devices, Feb. 2009, pp. 229-235.
[2.32] M. Drakaki, A. A. Hatzopoulos, S. Siskos, “De-Embedding Method for On-Wafer RF CMOS Inductor Measurements”, Microelectronics Journal, Elsevier, Volume: 40 Issue: 6 Pages: 958-965, JUN 2009.
[2.33] Papadopoulos, N. P., Hatzopoulos A. A., Papakostas D.K., Picos R., Dimitriadis Ch. A., Siskos S., “A Light-impact model for n-type and p-type poly-Si TFTs”, IEEE Journal of Display Technology, Volume: 5 Issue: 7 Pages: 265-272, JUL 2009.
[2.34] M. Dimopoulos, A. Spyronasios, D. Papakostas, A. A. Hatzopoulos, “Wavelet-based Mixed-Signal Testing Using Supply Current Measurements”, IET Science, Measurement & Technology, Volume: 4 Issue: 2 Pages: 76-85, MAR 2010.
[2.35] N. P. Papadopoulos, D. K. Papakostas, A. A. Hatzopoulos, “Current-based Testing of Optical Feedback Pixel Driver”, IEEE Journal of Display Technology, Volume: 6 Issue: 4 Pages: 150-157. APR 2010
[2.36] Papakostas D. K., Hatzopoulos A. A., “Improved analogue fault coverage estimation using probabilistic analysis”, Int. J. of Circuit Theory and Applications, Volume: 38 Issue: 5 Pages: 503-514, JUN 2010.
[2.37] Bontzios YI, Hatzopoulos AA, “A Unified Method for Calculating Capacitive and Resistive Coupling Exploiting Geometry Constraints on Lightly and Heavily Doped CMOS Processes”, IEEE TRANSACTIONS ON ELECTRON DEVICES Volume: 57 Issue: 8 Pages: 1751-1760, AUG 2010.
[2.38] M. Dimopoulos, D. Papakostas, A. Spyronasios, D. Konstantinou, A. A. Hatzopoulos, “Circuit Implementation of a Supply Current Spectrum Test Method”, IEEE Tr. on Instrumentation & Measurement, Volume: 59 Issue: 10 Pages: 2660-2670, OCT 2010.
[2.39] Y. Bontzios, M. Dimopoulos, A. Hatzopoulos, “An evolutionary method for efficient computation of mutual capacitance for VLSI circuits based on the method of images”, Simulation Modelling Practice and Theory, Vol. 19, Iss. 2, pp 638-648, Feb. 2011.
[2.40] A. Spyronasios, M. Dimopoulos, A. A. Hatzopoulos, “Wavelet analysis for the detection of parametric and catastrophic faults in mixed-signal circuits”, IEEE Tr. on Instrumentation & Measurement, Volume: 60 Issue: 6 Pages: 2025-2038, June 2011.
[2.41] Y. Bontzios, M. Dimopoulos, A. Hatzopoulos, “A Non-Destructive Method for Accurately Extracting the Substrate Parameters of Arbitrary Doping Profile in Nanoscale VLSI”, IEEE Tr. on Instrumentation & Measurement, Vol. 60, no. 9, pp. 3173-3184, Sept. 2011.
[2.42] Papadopoulos, N.P., Hatzopoulos, A.A., Marsal, A., Puigdollers, J., Picos, R., “Current and voltage simulation of an organic inverter”, International Journal of High Speed Electronics and Systems 20 (4) , 2011, pp. 843-851.
[2.43] Tsatsoulis, N.A., Bontzios, Y.I., Dimopoulos, M.G., Hatzopoulos, A.A., “Closed-form expressions for the coupling capacitance of metal fill tiles in VLSI circuits”, Microelectronics Journal, article in press, 2012.
[2.44] Papadopoulos, N.P., Marsal, A., Picos, R., Puigdollers, J., Hatzopoulos, A.A. “Simulation of organic inverter”, Solid-State Electronics, vol. 68 , 2012, pp. 18-21
[2.45] Drakaki, M., Siskos, S., Hatzopoulos, A., “A 0.5-20 GHz bandwidth enhanced distributed amplifier”,
Microelectronic Engineering, vol. 90 , 2012, pp. 26-28
[2.46] Angeliki Koupa, Michael Zervas, Yusuf Leblebici, A.A. Hatzopoulos, “Electrical Modelling and Characterization of Through Silicon Vias”, submitted 2012.
[2.47] Papagiannopoulos, I., Chatziathanasiou, V., Hatzopoulos, A. A., Kałuza, M., Wiecek, B.,De Mey, G., “Thermal analysis of integrated spiral inductors”, Infrared Physics and Technology, Volume 56, January 2013, Pages 80-84.
3. Publications in proceedings of conferences with review process
[3.1] Hatzopoulos A.A., Kontoleon J.M., “An Improved Algorithm for Non-linear Fault Diagnosis”, Proc. of Int. AMSE Conf. on Modeling and Simulation, vol. 2.2, pp 27-36, June 1984.
[3.2] Hatzopoulos A.A., “Computer-aided fault diagnosis of electronic systems”, Proc. 3rd Greek Conference on Informatics, pp. 576-589, Athens, May 1991.
[3.3] Papakostas D.K., Hatzopoulos A.A., “Fault diagnosis of integrated circuits”, Proc. 6th Greek Conference of Physics, Thrace, Greece, 18-21 March, 1993.
[3.4] Papakostas D.K., Hatzopoulos A.A., “Fault detection in linear bipolar ICs: comparative results between power supply current and output voltage measurements”, Proc. IEEE Int. Symp. on Circuits & Systems, ISCAS ’94, pp 5.61-5.64, May 1994.
[3.5] Papakostas D.K., Ioannou A. A., Hatzopoulos A.A., “Fault identification in analog circuits using current spectrum measurements”, Proc. 8th Int. Symp. on Theoretical Electrical Eng., ISTET ’95, pp 40-43, Sep. 1995.
[3.6] Papakostas D.K., Ioannou A. A., Hatzopoulos A.A., ” Current spectrum measurements for analog fault diagnosis”, Digest of papers in Workshop on Iddq testing, IDDQ’95, Washington D.C., Oct. 1995.
[3.7] Wang C.P., Hatzopoulos A.A., Wey C-L., “A test paradigm for analog and mixed-signal circuits and systems”, Proc. IEEE Int. Symposium on Circuits & Systems, ISCAS’96, vol.3, pp. 194-197, Atlanta, GA, May, 1996.
[3.8] Hatzopoulos A.A., Siskos S., “A versatile mixed-signal test structure using current conveyors”, Proc. IEEE Int. Mixed-signal Testing Workshop, IMSTW’96, pp. 193-197, Quebec, CA, May, 1996.
[3.9] Papakostas D.K., Κosmidis V., Hatzopoulos A.A., “Analog fault detectability based on statistical circuit analysis”, Proc. IEEE Int. Conf. on Electronics, Circuits & Systems, ICECS ’96, vol.2, pp. 1076-1079, Rhodes, Greece, Oct. 1996.
[3.10] Siskos S., Laopoulos Th., Hatzopoulos A.A., Bafleur M.“A current conveyor based BIC sensor for current monitoring in mixed-signal circuits”, Proc. IEEE Int. Conf. on Electronics, Circuits & Systems, ICECS ’96, vol.2, pp. 1210-1212, Rhodes, Greece, Oct. 1996.
[3.11] Hatzopoulos A., G. Koukas, G. Mpinos, V. Petridis, A. Kehagias, “Analog implementation of the Incremental Credit Assignment (ICRA) scheme for time series classification”, Proc. Int. Conf. on Digital Signal Processing, DSP’97, Greece, 1997.
[3.12] Makrigiannis E., Hatzopoulos A.A., “Microcontroller based on-line testing of analog and mixed-signal systems”, Proc. Int. On-Line Testing workshop, IOLTW’97, Crete, Greece, 1997.
[3.13] Hatzopoulos A.A., “Computer-aided circuit analysis and design in an undergraduate Electronics curriculum”, Proc. Int. Workshop on CAD in Electromagnetism and Electrical Circuits, CADEMEC’97, Romania, 1997.
[3.14] Hatzopoulos A.A., Siskos S., “Design of a simple built-in current sensor for analog and mixed-signal testing”, Proc. ECCTD’97, Hungary, 1997.
[3.15] Papakostas D.K., Palouktsoglou G.M., Hatzopoulos A.A., “Estimation of statistical variables for analog circuit parameter evaluation”, Proc. IEEE Int. Conf. on Electronics, Circuits & Systems, ICECS ’97, Cairo, Egypt, Dec. 1997.
[3.16] Vlassis S., Siskos S., Hatzopoulos A., Petridis V., Kehagias A., “Analog CMOS design of the Incremental Credit Assignment (ICRA) scheme for time series classification”, Proc. IEEE Int. Symposium on Circuits & Systems, ISCAS’98, Monterey, CA, 1998.
[3.17] A. A. Hatzopoulos, An. Sifniadis, “Improved procedures for testing analog and mixed-signal circuits using a microcontroller”, Proc. IEEE Int. Conf. on Electronics, Circuits & Systems, ICECS ’99, Paphos, Cyprus, 1999.
[3.18] A. Hatzopoulos, “Power dissipation considerations in low-voltage CMOS circuits”, Proc. Conf. Microelectronics, Microsystems and Nanotechnology, MMN’2000, Athens, Greece, Nov. 2000.
[3.19] Α. Hatzopoulos, P. Bougia, “A Design tool for planar Inductors using Cadence software”, Proc. 12th IEEE Mediterranean Electrotechnical Conference, MELECON 2004, Dubrovnic, Croatia, 2004, pp 147-150.
[3.20] A.A. Hatzopoulos, S. Siskos, C.A. Dimitriadis, N. Papadopoulos, I. Pappas and L. Nalpantidis, “A Built-In Current Sensor using Thin-Film Transistors”, Conf. on Microelectronics, Microsystems and Nanotechnology MMN’2004, Athens, Greece, Nov. 2004
[3.21] I. Pappas , L. Nalpantidis , V. Kalenteridis , S. Siskos , C. A. Dimitriadis and A. A. Hatzopoulos, “A study of different types of current mirrors using polysilicon TFTs”, Conf. on Microelectronics, Microsystems and Nanotechnology, MMN’2004, Athens, Greece, Nov. 2004
[3.22] A.T. Hatzopoulos, D.H. Tassis, T.A. Hastas, C.A. Dimitriadis, S. Siskos, A.A. Hatzopoulos, “A Simple and continuous on-state current model of Polysilicon Thin-Film Transistor for Circuit Simulation”, Conf. on Microelectronics, Microsystems and Nanotechnology MMN’2004, Athens, Greece, Nov. 2004.
[3.23] A.A. Hatzopoulos, S. Siskos, “Built-In Current Sensor using Floating-Gate MOS Transistors for Low-Voltage Applications”, Proc. XIX Conference on Design of Circuits & Integrated Systems, DCIS ’04, Bordeaux, Nov. 2004.
[3.24] A.A. Hatzopoulos, S. Siskos, C.A. Dimitriadis, N. Papadopoulos, “Built-In Current Sensor with reduced voltage drop using Thin-Film Transistors”, Proc. IEEE Int. Symposium on Circuits & Systems, ISCAS’05, Kobe, Japan, May 2005.
[3.25] A.A. Hatzopoulos, S. Stefanou, G. Gielen, D. Schreurs, “Analysis of coil parameter extraction methods for on-chip inductor design”, Proc. ECCTD 05, Cork, Ireland, Aug. 2005.
[3.26] Papakostas D.K., Hatzopoulos A.A., “Fault Detectability of Double Analogue Measurements using Probabilistic Analysis”, Proc. 5th Int. Conf. on Technology and Automation, ICTA 05, Thessaloniki, October 15-16, 2005.
[3.27] Papakostas D.K., Hatzopoulos A.A., “A Fault Diagnosis Expert System Structure with Knowledge Retrieving Capability from Waveforms”, Proc. 5th Int. Conf. on Technology and Automation, ICTA 05, Thessaloniki, October 15-16, 2005.
[3.28] A.A. Hatzopoulos, S. Stefanou, G. Gielen, D. Schreurs, “Impact of parameter extraction methods on integrated inductor design”, Proc. XX Conference on Design of Circuits & Integrated Systems, DCIS ’05, Lisbon, Nov. 2005.
[3.29] A.A. Hatzopoulos, S. Eleftherakis, “A tool for optimal design of integrated Inductors using Cadence software”, Proc. XX Conference on Design of Circuits & Integrated Systems, DCIS ’05, Lisbon, Nov. 2005.
[3.30] I. Makrygiannis, A.A. Hatzopoulos, G. Gielen “A simplified model for the substrate noise simulation”, Proc. XX Conference on Design of Circuits & Integrated Systems, DCIS ’05, Lisbon, Nov. 2005.
[3.31] I. Pappas, V. Kalenteridis, L. Nalpantidis, S. Siskos, Ch. Dimitriadis, A.A. Hatzopoulos, “A new analogue driver using Poly-Si Thin-Film Transistors for Active Matrix Displays”, Proc. XX Conference on Design of Circuits & Integrated Systems, DCIS ’05, Lisbon, Nov. 2005.
[3.32] T. Noulis, S. Siskos, G. Sarrabayrouse, L. Bary, A. A. Hatzopoulos, “Detailed Study of BSIM3v3 Flicker Noise Models in NMOS and PMOS Transistors from Threshold to Saturation”, Proc. XX Conference on Design of Circuits & Integrated Systems, DCIS ’05, Lisbon, Nov. 2005.
[3.33] I. Pappas, A. T. Hatzopoulos, D. H. Tassis, N. Arpatzanis, S. Siskos, A.A. Hatzopoulos, C. A. Dimitriadis and G. Kamarinos, “A Simple Polysilicon Thin-Film Transistor SPICE Model”, Proc. 25th Int. Conf. on Microelectronics (MIEL 2006), Belgrade, Serbia, May, 2006, pp. 513-516 .
[3.34] N. P.Papadopoulos, A.A. Hatzopoulos, D.K. Papakostas, C.A. Dimitriadis, S. Siskos , “Estimating the influence of light on the performance of polycrystalline thin-film transistors at the sub-threshold region”, Proc. 13th IEEE Mediterranean Electrotechnical Conference, MELECON 2006, Málaga, Spain, May 2006.
[3.35] A. A. Hatzopoulos, S. Stefanou, G. Gielen, D. Schreurs, `Assessment of Parameter Extraction Methods for Integrated Inductor Design and Model Validation` , Proc. IEEE Int. Symposium on Circuits & Systems, ISCAS`06, Greece, May 2006.
[3.36] I. Pappas, L. Nalpantidis, V. Kalenteridis, S. Siskos, A.A. Hatzopoulos, Ch. Dimitriadis, “A threshold voltage variation cancellation technique for analogue peripheral circuits of a display array using poly-Si TFTs”, Proc. IEEE Int. Symposium on Circuits & Systems, ISCAS`06, Greece, May 2006, pp. 3305-3308.
[3.37] N. P. Papadopoulos, A. A. Hatzopoulos, D. K. Papakostas, Ch. A. Dimitriadis, S. Siskos, “Modeling the impact of light on the performance of polycrystalline thin-film transistors at the sub-threshold region”, Proc. IEEE Int. Symposium on Circuits & Systems, ISCAS`06, Greece, May 2006, pp. 429-432.
[3.38] N. Arpatzanis, C.A. Dimitriadis, S. Siskos, A. A. Hatzopoulos, G. Kamarinos, “Determination of bulk and interface density of states in polycrystalline silicon thin film transistors”, 5th Symposium on Thin Films for Large Area Electronics held at the EMRS 2006 Spring Meeting, Nice, FRANCE, JUN, 2006.
[3.39] D. K. Papakostas, A. A. Hatzopoulos, “Analog measurements Fault Detectability using Probabilistic Analysis”, Proc. XXI Conference on Design of Circuits & Integrated Systems, DCIS ’06, Barcelona, Nov. 2006.
[3.40] N. P. Papadopoulos, A. A. Hatzopoulos, H. Pappas, D. K. Papakostas, S. Siskos, C.A. Dimitriadis, “SPICE Model for the simulation of the Light impact on the performance of polycrystalline Thin-Film Transistors”, Proc. XXI Conference on Design of Circuits & Integrated Systems, DCIS ’06, Barcelona, Nov. 2006.
[3.41] M. Drakaki, A. A. Hatzopoulos, S. Siskos, “Improving the accuracy of the De-embedding methods for on-wafer RF measurements”, Proc. XXI Conference on Design of Circuits & Integrated Systems, DCIS ’06, Barcelona, Nov. 2006.
[3.42] A. A. Hatzopoulos, A. Spyronasios, `A New Model for single and multiple Interconnects in RF CMOS Integrated Circuits”, Proc. XXI Conference on Design of Circuits & Integrated Systems, DCIS ’06, Barcelona, Nov. 2006.
[3.43] M. Drakaki, A. A. Hatzopoulos, S. Siskos, “CMOS Inductor Performance Estimation Using Z- and S-Parameters”, Proc. IEEE Int. Symposium on Circuits & Systems, ISCAS’07, New Orleans, USA, 2007, pp. 2256-2259.
[3.44] N.P.Papadopoulos, A.A. Hatzopoulos, D.K. Papakostas, “New Optical Feedback Pixel driver circuit and its Simulation in SPICE”, 27th IDRC, SID Conference Record of the International Display Research Conference, pp. 437-440, EuroDisplay 2007, Moscow, Russia, September 2007.
[3.45] D. K. Papakostas, A. A. Hatzopoulos “Impact of circuit Parameter Derivative Calculation on Estimation of Statistical variables for Analog Fault Detectability Evaluation”, Proc. IMSTW’07, Portugal, 2007.
[3.46] N.P.Papadopoulos, A.A. Hatzopoulos, D.K. Papakostas, C.A. Dimitriadis and S. Siskos, “Verifying the Spice Model for the Simulation of Light impact on the performance of poly-TFT”, Proc. 4th International Workshop on Nanosciences and Nanotechnologies, NN07, Thessaloniki, Greece, 2007
[3.47] M.G. Dimopoulos, D. K. Papakostas, A. A. Hatzopoulos, E. I. Konstantinidis, A. D. Spyronasios, “Design and Development of a Versatile Testing System for Analog and Mixed-Signal Circuits”, Proc. ECCTD 07, Sevilla, Spain, Aug. 2007, pp. 846-849.
[3.48] M. Drakaki, A. A. Hatzopoulos, S. Siskos, “Improving the Quality Factor Estimation for Differentially Driven RF CMOS Inductor “, Proc. ECCTD 07, Sevilla, Spain, Aug. 2007, pp. 599-602.
[3.49] M. Drakaki, A. A. Hatzopoulos, S. Siskos, D. K. Papakostas, “Comparison of RF Inductor Performance Evaluation Methods”, Proc. 6th Int. Conf. on Electronics, Hardware, Wireless and Optical Communications EHAC ’07, pp. 35-39, Corfu Island, Greece, February, 2007.
[3.50] M. Drakaki, A. A. Hatzopoulos, S. Siskos, “A Comparative Evaluation of De-Embedding Methods for on-Wafer RF CMOS Inductor S-parameter Measurements”, Conf. on Microelectronics, Microsystems and Nanotechnology, MMN’2007, Athens, Greece, Nov. 2007.
[3.51] M.G. Dimopoulos, D. K. Papakostas, A. A. Hatzopoulos, E. I. Konstantinidis, A. D. Spyronasios, “Microcontroller-based Production-Line Testing”, Proc. XXII Conference on Design of Circuits & Integrated Systems, DCIS ’07, Sevilla, Spain, Nov. 2007, pp. 553-557.
[3.52] Yiorgos Bontzios, A.A. Hatzopoulos, S. Stefanou, Konstantinos Nikelis, “A Scalable Model for Calculating Resistive Losses on Lightly and Heavily Doped Substrates”, Proc. XXII Conference on Design of Circuits & Integrated Systems, DCIS ’07, Sevilla, Spain, Nov. 2007.
[3.53] M. Drakaki, A. A. Hatzopoulos, S. Siskos, “Improved Calculation of Differentially Driven RF CMOS Inductor Model Parameters, ”, Proc. XXII Conference on Design of Circuits & Integrated Systems, DCIS ’07, Sevilla, Spain, Nov. 2007.
[3.54] A.A. Hatzopoulos, D. Schreurs, G. Gielen, A. D. Spyronasios, “Integrated inductor quality factor enhancement considerations”, Proc. XXII Conference on Design of Circuits & Integrated Systems, DCIS ’07, Sevilla, Spain, Nov. 2007.
[3.55] M.G. Dimopoulos, D. K. Papakostas, D. K. Konstantinou, A. D. Spyronasios A. A. Hatzopoulos, “Multiple Parametric Circuit Analysis Tool for Detectability Estimation”, Proc. ICECS 07, Morrocco, Dec. 2007, pp. 1111-1114.
[3.56] D. K. Konstantinou, M. G. Dimopoulos, D. K. Papakostas, A.A. Hatzopoulos, A. Spyronasios, “Testing an Emergency Luminaire Circuit Using a Fault Dictionary Approach”, Proc. 11th IEEE Workshop on Design and Diagnostics of Electronic Circuits & Systems (DDECS 2008), Slovakia, April 2008, pp. 251-254.
[3.57] D. K. Konstantinou, M. G. Dimopoulos, D. K. Papakostas, A.Spyronasios, A. A. Hatzopoulos, “Simulation and Measurements for Testing an Emergency Luminaire Circuits”, Proc. 14th IEEE Mediterranean Electrotechnical Conference, MELECON 2008, Corsica, France, May 2008, pp. 646-650.
[3.58] N.P.Papadopoulos, A.A. Hatzopoulos, D.K. Papakostas, Rodrigo Picos, C.A. Dimitriadis and S. Siskos, “A New Light-impact Model for p-type and n-type poly-TFT”, Intern. Symposium on Flexible Organic Electronics (IS-FOE ’08), Chalkidiki, Greece, July, 2008.
[3.59] M. G. Dimopoulos, D. K. Papakostas, A.Spyronasios, A.A. Hatzopoulos, D. K. Konstantinou, “Power Supply Current Testing in the Production Line of Emergency Luminaire Circuits”, Proc. IEEE Int. Conf. on Electronics, Circuits & Systems, ICECS ’08, Malta, Aug. 2008, pp. 778-781.
[3.60] Yiorgos Bontzios, A.A. Hatzopoulos, “A New Method for Calculating Resistive Losses on Lightly and Heavily Doped Substrates”, Proc. 16th IFIP/IEEE Int. Conf. on Very Large Scale Integration, VLSI-SOC’08, Rhodes, Greece, 2008.
[3.61] M. G. Dimopoulos, A.Spyronasios, D. K. Papakostas, D. K. Konstantinou, A.A. Hatzopoulos, “Wavelet-based Mixed-Signal Testing Using Supply Current Measurements”, Proc. XXIII Conference on Design of Circuits & Integrated Systems, DCIS ’08, Grenoble, France, Nov. 2008.
[3.62] Chatziathanasiou V., Hatzopoulos A.A., Papagiannopoulos I. “Simulation and measurements of the thermal behavior of integrated inductors”, Proc. 4th European Advanced Technology Workshop on Micro-packaging and Thermal Management, La Rochelle, France, Feb. 2009.
[3.63] N.P.Papadopoulos, A.A. Hatzopoulos, D.K. Papakostas, “Testing of an Optical Feedback Pixel Driver Using Supply Current” , Proc. 16th International Conference Mixed Design of Integrated Circuits and Systems, MIXDES 2009, Łódź, Poland, June 2009.
[3.64] M. Dimopoulos, A. Spyronasios, D. Papakostas, D. Konstantinou, B. Vassios, A.A. Hatzopoulos, “Analog and Mixed-Signal Testing by Wavelet Transformations of Power Supply Current Measurements”, Proc. 16th International Conference Mixed Design of Integrated Circuits and Systems, MIXDES 2009, Łódź, Poland, June 2009.
[3.65] M. E. Kiziroglou, A. Α. Hatzopoulos, M. K. Husain and C. H. de Groot, «Simulation of spin-wise transmission at Schottky contacts», 6th International Workshop on Nanosciences and Nanotechnologies, NN09, Thessaloniki, Greece, 2009.
[3.66] Chatziathanasiou V., Hatzopoulos A.A., Papagiannopoulos I., “Thermal behavior of integrated inductors: a case study”, 16th Int. Conf. on Thermal Engineering and Thermogrametry, THERMO’09, Budapest, July, 2009
[3.67] D. Konstantinou, M. Dimopoulos, D. Papakostas, S. Stathis, G. Goudelis, A.A. Hatzopoulos, “Pattern Recognition Methods Application for Analog Circuit Fault Detection” – XXIV Conference on Design of Circuits and Integrated Systems (DCIS 2009), Zaragoza, Spain, 18-20 November 2009.
[3.68] Yiorgos Bontzios, Alkis Hatzopoulos, “A Margarita Shaped Inductor Offering Wider Frequency Range in Comparison with Spiral Inductors”, Presented in 39th European Solid-State Device Research Conference, ESSDERC 2009, Athens, Sept. 2009.
[3.69] N. Papadopoulos, A. Marsal, J. Puigdoller, A.A. Hatzopoulos, “Fabrication of complementary Organic Inverters with different W/L ratios”, Proc. ISFE 2010, Mallorca, Spain, Apr. 2010
[3.70] N. Papadopoulos, A. Marsal, J. Puigdoller, A.A. Hatzopoulos, “Fabrication and Simulation of complementary Organic Inverter”, Proc. ISFE 2010, Mallorca, Spain, Apr. 2010
[3.71] Y. Bontzios, A.A. Hatzopoulos, “A Universal Model for Calculating Capacitive and Resistive Coupling on Lightly and Heavily Doped CMOS Processes”, Proc. 17th International Conference Mixed Design of Integrated Circuits and Systems, MIXDES 2010, Wroclaw, Poland, June 2010.
[3.72] M. G. Dimopoulos, A. D. Spyronasios, A.A. Hatzopoulos, “Wavelet Energy-based Mahalanobis Distance Metric for Testing Analog and Mixed-Signal Circuits”, Proc. 17th International Conference Mixed Design of Integrated Circuits and Systems, MIXDES 2010, Wroclaw, Poland, June 2010.
[3.73] N.P. Papadopoulos, R. Picos, A. Marshal, J. Puigdollers, R. Alcubilla, A.A. Hatzopoulos, Fabrication of a Complementary Organic Inverter and its modeling and Simulation in CADENCE”, Proc. Intern. Symposium on Flexible Organic Electronics, IS-FOE 2010, Chalkidiki, Greece, July 2010
[3.74] M. G. Dimopoulos, D. K. Papakostas, B. D. Vassios A.A. Hatzopoulos, “Wavelet Analysis of Current Measurements for Mixed-Signal Circuit Testing”, Proc. IEEE Int. Symposium on Circuits & Systems, ISCAS’10, Paris, France, May 2010.
[3.75] A. D. Spyronasios, M. G. Dimopoulos, N.P. Papadopoulos, A.A. Hatzopoulos, “Testing Parametric and Catastrophic Faults in Mixed-Signal Integrated Circuits using Wavelets”, Proc. ISVLSI 2010, Kefalonia, Greece, July 2010
[3.76] M. G. Dimopoulos, A. D. Spyronasios, A.A. Hatzopoulos, “Wavelet Analysis of Measurements for On-Line Testing Analog & Mixed-Signal Circuits”, Proc. IOLTS 2010, Corfu, Greece, July 2010
[3.77] Yiorgos Bontzios, Alkis Hatzopoulos, “A Comparison of Substrate Coupling Noise Between Heavily and Lightly Doped Processes With a Grounded Backplane Contact”, XXV Conference on Design of Circuits and Integrated Systems (DCIS 2010), Lanzarote, Spain, November 2010.
[3.78] A. D. Spyronasios, M. G. Dimopoulos, D. Papakostas, A.A. Hatzopoulos “Support Vector Machine Methods Application for Analog & Mixed-Signal Circuit Fault Detection” XXV Conference on Design of Circuits and Integrated Systems (DCIS 2010), Lanzarote, Spain, November 2010.
[3.79] M. G. Dimopoulos, A. D. Spyronasios, N.P. Papadopoulos, A.A. Hatzopoulos, “Efficient Testing of an Optical Feedback Pixel Driver Using Wavelet Analysis”, Proc. IEEE Int. Conf. on Electronics, Circuits & Systems, ICECS ’10, Athens, Greece, Dec. 2010.
[3.80] Y. Bontzios, M. G. Dimopoulos, A.A. Hatzopoulos, “Efficient Inductance Calculation for Long and Medium Length Rectangular Interconnects in VLSI Circuits”, Proc. IEEE Int. Symposium on Circuits & Systems, ISCAS’11, Rio De Janeiro, Brazil, May 2011.
[3.81] Υ. Bontzios, M. Dimopoulos, A. Hatzopoulos, “Exact Closed-form Expressions For Substrate Resistance and Capacitance Extraction in Nanoscale VLSI,” 6th International conference on Design & Technology of Integrated Systems in nanoscale era (DTIS 2011), Athens, 6-8 April 2011.
[3.82] Y. Bontzios, M. Dimopoulos, A. Hatzopoulos, “A Wideband Scalable and SPICE-Compatible Model for On-Chip Interconnects Coupling Up to 60 GHz,” 6th International conference on Design & Technology of Integrated Systems in nanoscale era (DTIS 2011), Athens, April 2011.
[3.83] Y. Bontzios, M. Dimopoulos, A. Hatzopoulos, “A memetic algorithm for computing 3D capacitance in multiconductor VLSI circuits”, IEEE 14th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS), 2011, pp. 341 – 346
[3.84] Y. Bontzios, M. Dimopoulos, A. Hatzopoulos, “Automated Substrate Resistance Extraction in Nanoscale VLSI by Exploiting a Geometry-based Analytical Model”, IEEE 18th Int. Conf. on Mixed Design of Integrated Circuits and Systems, (MIXDES 2011), Gliwice, Poland 16-18 June 2011
[3.85] Y. Bontzios, M. Dimopoulos, A. Hatzopoulos, “Closed-Form Expressions for the Coupling Capacitance Between Through Silicon Vias and Interconnects for 3D ICs,” 18th Int. Conf. Mixed Design of Integrated Circuits and Systems, (MIXDES 2011), Gliwice, Poland, 16-18 June 2011
[3.86] N.P.Papadopoulos, A.A. Hatzopoulos, D.K. Papakostas, Rodrigo Picos, C.A. Dimitriadis, “Using the Light-impact Model for p-type and n-type poly-TFT in circuits”, IEEE 18th Int. Conf. on Mixed Design of Integrated Circuits and Systems, (MIXDES 2011), pp. 113-118, Gliwice, Poland 16-18 June 2011
[3.87] Y. Bontzios, M. Dimopoulos, A. Hatzopoulos, “Prospects of 3D Inductors on Through Silicon Vias Processes for 3D ICs,” 19th IFIP/IEEE International Conference on Very Large Scale Integration, (VLSI-SoC 2011), pp. 90-93, Hong Kong, China, October 3–5, 2011.
[3.88] Y. Bontzios, M. Dimopoulos, N. Tsatsoulis, A. Hatzopoulos, “Closed-Form Expressions for the Coupling Capacitance of Metal Fill Tiles in VLSI Circuits,” XXVI Conference on Design of Circuits and Integrated Systems, (DCIS 2011), pp. 471-474, Albufeira, Portugal, 16-18 November 2011.
[3.89] Pappas, I., Siskos, S., Hatzopoulos, A.A. “A new analog output buffer for data driver of active matrix displays using low-temperature polycrystalline silicon thin-film transistors”, Proc. of the IEEE 15th Int. Symposium on Design and Diagnostics of Electronic Circuits and Systems, DDECS 2012
[3.90] I. Pappas, S. Siskos, A.A. Hatzopoulos, “Design of an Analog Output Buffer for Active Matrix Displays Using Low-Temperature Polycrystalline Silicon Thin-Film Transistors”, Proc. 19th International Conf. Mixed Design of Integrated Circuits and Systems, MIXDES 2012, Warsaw, Poland, May 2012.
[3.91] Y. Bontzios, M. Dimopoulos, A. Hatzopoulos, “Extending the Closed-form Expressions For Substrate Resistance and Capacitance Extraction for practical non-ideal shapes,” XXVII Conference on Design of Circuits and Integrated Systems, (DCIS 2012), Avignon, France, 27-30 November 2012.
